Time-resolved x-ray line intensities for diagnostics of laser-produced plasmas (abstract)

We have developed a streaked crystal spectrograph for time-resolving x-ray lines from laser-produced plasmas. The spectrograph combines an ellipsoidally curved crystal and x-ray streak camera to optimize spectral coverage and resolution, even though the instrument is located a meter from the source. The instrument has been used at Novette to measure S lines doped in concentrations of 4% in the center of CH foils. Time histories of the temperature and density of the CH plasma have been derived from relative intensities of the S lines. Details of the experiment and analysis will be presented along with the instrument design.