Smectic structures in electrochemically prepared poly(3,4‐ethylenedioxythiophene) films

Sub‐micrometer layers of electrochemically prepared methyl‐ and decyl‐substituted poly(3,4‐ethylenedioxythiophene) (PEDOT) carrying perchlorate counterions have been examined with grazing incidence X‐ray diffraction with synchrotron radiation. The materials were found to be partially crystalline, and the data could be ascribed to a model of sheets of π‐π stacked polymer chains with a smectic ordering of these sheets. An unsubstituted PEDOT sample with the polymeric polystyrenesulfonic acid as a counterion was also investigated and turned out to be essentially amorphous.