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January 1, 1990Materials Transactions JIMOpen Access

Characterization of Crystal Defects by Cathodoluminescence Detection System Combined with TEM

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NYNaoki YamamotoTokyo Institute of Technology

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Naoki Yamamoto (1990) studied this question.

synapsesocial.com/papers/6aa036f2184855e63a6967bfhttps://doi.org/10.2320/matertrans1989.31.659
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