A method of measuring the phenomenological Landau-Ginzburg coefficients in an expansion of the free energy of ferroelectrics near the phase transition is proposed. This method is based on simultaneously recording five Fourier components of the current response to a sinusoidal voltage as a function of temperature. An analysis is made of a specific application of the method to Langmuir-Blodgett ultrathin ferroelectric films.
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Palto et al. (2000) studied this question.
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