Remeasurement of the CuKα1 Emission X-Ray Wavelength in the Metrical System (Present Stage)

Using a crystal which lattice parameter is measured firstly with simultaneous X-ray and optical interferometry in the metrical system and secondly with a diffractometric measurement with respect to the X-ray line the wavelength of the characteristic CuKα1 emission line is remeasured with an accuracy, Δλ/λ, of about 3 × 10−7 in the metrical system.