We present ferromagnetic resonance scans of epitaxial thin films of La0.7Sr0.3MnO3. In most films, the resonance field indicates the presence of large stresses, the line is wide and both the field and width vary significantly with position. However, in the perpendicular geometry (field normal to the film plane) the best films show narrow lines (<20 Oe) which are relatively independent of position, indicative of magnetic homogeneity. The experiments show that this technique can be used as a contactless, nondestructive diagnostic tool for assessing the magnetic quality of colossal magnetoresistance thin films.
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Lofland et al. (1999) studied this question.
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