Transparent conducting SnO2 films prepared by chemical vapor deposition were damage tested at 1062 nm using an electro-optically (EO) Q-switched Nd:glass laser emitting 15-ns pulses. The damage threshold energy densities for films of thickness 151.0 and 140.9 nm were found to be 18.2±1.3 and 15.9±1.1 J/cm2, respectively. These films find application in large aperture Pockels cells and other EO modulators for pulse shaping and gating purposes in high power laser amplifiers.
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Subhash et al. (1983) studied this question.
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