A potentially more cost‐efficient method of growing single‐crystal relaxor‐based ferroelectric materials has been investigated. Seed single crystals of Pb(Mg 1/3 Nb 2/3 )O 3 (PMN)—;35 mol% PbTiO 3 (PT) were embedded within polycrystalline powders and annealed at temperatures from 900° to 1200°C. The boundary of the single crystal migrated through the polycrystal matrix under the influence of grain boundary curvature; growth distances of several millimeters were observed, verifying the feasibility of the approach. The grown single crystals exhibited macroscopic cubic growth morphologies with (100) faces. Strain levels as high as 0.68% under an electric field of 30 kV/cm were observed in initial measurements.
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Li et al. (1998) studied this question.
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