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May 1, 1978IBM Journal of Research and Development

Sputter Profiling Through Ni/Fe Interfaces by Auger Electron Spectroscopy

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Authors

TCT. J. ChuangLawrence Berkeley National LaboratoryKWK. WandeltUniversity of Bonn

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Cite This Study

Chuang et al. (1978) studied this question.

synapsesocial.com/papers/6aa2405643c640b0446ee890https://doi.org/10.1147/rd.223.0277
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