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October 1, 1971Journal of Physics E Scientific InstrumentsOpen Access

Measuring surface variations with the scanning electron microscope using deposited contamination lines

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RHRaymond A. HooverIBM (United States)

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Raymond A. Hoover (1971) studied this question.

synapsesocial.com/papers/6aa24da4ca7d77e1d71dd496 https://doi.org/10.1088/0022-3735/4/10/009

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