The statistical properties of the fluorescence lifetime of single emitters in disordered systems are discussed. The contribution of radiative and nonradiative processes to the spontaneous decay rate is analyzed using a simple analytical model, in full agreement with exact numerical simulations. The relative fluctuations of the decay rate are shown to exhibit two well-defined regimes dominated either by near-field scattering or by absorption processes. In both regimes, the averaged apparent quantum yield remains high enough to permit practical measurements. Lifetime fluctuations could thus be used a probe of the local environment in complex systems at the nanometer scale.
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Froufe‐Pérez et al. (2007) studied this question.
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