The ability to determine the structure of a sample at atomic resolution is crucial for the development of nanotechnology and materials science. Consequently, structure retrieval must become a quantitative rather than a qualitative exercise. A method to retrieve the projected potential of a crystalline sample by inversion from an exit-surface wavefunction in high-resolution electron microscopy is proposed. This method accounts for both multiple scattering and absorption.
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O'Leary et al. (2005) studied this question.
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