The atomic force microscopy is used to study surface morphology of carbon nitride CN x and europium-oxide-doped carbon nitride CN x :Eu y O z films prepared by a direct-current magnetron.A clear correlation between the growth parameters and the resulting film structure is observed.It is established that the presence of a rare earth metal oxide leads to a structural ordering of the film surface.The self-organization processes within the films are investigated.Luminescence spectra and luminescence bands of europium-oxide-doped films are obtained.
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