A quantitative measurement method of the linear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO 2 –Bi 2 Ti 4 O 11 ceramics with higher resolution than that obtained with needle-type SNDM.
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Ohara et al. (2002) studied this question.
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