Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Microscopy

The higher order nonlinear dielectric imaging technique using scanning nonlinear dielectric microscopy (SNDM) is investigated. The resolution of the higher order nonlinear dielectric imaging is much higher than that of the conventional nonlinear dielectric imaging which detects the lowest order of the nonlinear dielectric constant. It is demonstrated that this higher order imaging is very useful for observing a surface layer with a unit cell scale thickness formed on ferroelectric material.