Product or sum: comparative tests of Voigt, and product or sum of Gaussian and Lorentzian functions in the fitting of synthetic Voigt‐based X‐ray photoelectron spectra

A comparative study for the fitting of X‐ray photoelectron spectra (XPS) using different model functions is presented. Synthetically generated test spectra using Gaussian/Lorentzian convolution and a real measured spectrum are fitted with the three commonly used models: product, sum and Gaussian/Lorentzian convolution functions. In these limited tests, it was found that the sum function is superior to the product function, particularly for low‐noise spectra.