X‐ray diffraction patterns of stretched low‐temperature polybutadiene using molybdenum, copper, and chromium radiations

X‐ray diffraction patterns of stretched crystallized polybutadiene polymerized at −20°C were obtained using molybdenum, copper, and chromium characteristic x‐radiations on the same sample. The pattern obtained using molybdenum radiation showed diffraction effects in the 0, 1st, 2nd, 3rd, and 4th orders. The lack of detail in this pattern is partly due to the relatively intense background. By using the longer wavelength copper and chromium radiations the diffraction effects of the zero‐ and first‐order layer lines were brought out in considerable detail. The diffraction data obtainable from these layer line patterns may be useful in carrying out a structural analysis of crystalline polybutadiene.