Transport and strain relaxation in wurtzite InAs–GaAs core-shell heterowires

Indium-arsenide–gallium-arsenide (InAs–GaAs) core-shell, wurtzite nanowires have been grown on GaAs (001) substrates. The core-shell geometries (core radii 11 to 26 nm, shell thickness >2.5 nm) exceeded equilibrium critical values for strain relaxation via dislocations, apparent from transmission electron microscopy. Partial axial relaxation is detected in all nanowires increasing exponentially with size, while radial strain relaxation is >90%, but undetected in nanowires with both smaller core radii <16 nm and shell thicknesses <5 nm. Electrical measurements on individual core-shell nanowires show that the resulting dislocations are correlated with reduced electron field-effect mobility compared to bare InAs nanowires.