Low-temperature scanning tunneling microscope with a reliable piezoelectrical coarse approach mechanism

The design of a compact low-temperature scanning tunneling microscope (STM) with a reliably operated piezoelectrical coarse approach system is described. The tip translation device is based on a new principle of sequential and parallel longitudinal step motions of the balanced frictional supports of the STM tip. The instrument was successfully tested in a temperature range from 0.4 to 300 K. The design is well suited for low-temperature applications.