The growth mode of Cr on Ag(100) in the monolayer range has been studied by structure-sensitive methods. The data demonstrate that a flat single Cr monolayer is formed when the substrate temperature TS is kept at 430--450 K during the deposition of one layer equivalent, in contrast with lower (higher) Tₛ where multilayer formation (agglomeration) takes place. The monolayer is stable up to 460 K and electron diffraction at low energies ({≤}30 eV) reveals a weak but distinct c(2×{}2) superstructure attributed to two-dimensional antiferromagnetic order.
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Krembel et al. (1991) studied this question.
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