We propose optical techniques for the generation of a TEM 00 Gaussian beam which has a π phase flip in the electric field amplitudes between the two halves of the beam profile. The methods make use of a special waveplate and a masked Sagnac interferometer. The produced phase-flipped mode is the ideal light mode for optical measurements requiring high precision in one spatial dimension. Two examples of such applications are discussed.
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Delaubert et al. (2002) studied this question.
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