Non-destructive estimation of apple (MalusdomesticaBorkh.) leaf area

SummaryThere is a need for a non-destructive and relatively simple technique to measure leaf areas, particularly at locations where leaf area-measuring instruments are not readily available. The use of non-destructive methods, or taking leaf area measurements of attached leaves is required, particularly in situations where area measurements of the same leaf have to be taken at regular intervals throughout growth and development. In this study, a model has been developed with which to estimate apple leaf areas based on the product of leaf length and leaf width. No such model was previously available to measure or estimate apple leaf areas.