Mesoporous SiO 2 composite films with small Ag particles or clusters dispersed in them were prepared by a new method: first the matrix SiO 2 films were prepared by the sol–gel process combined with the dip-coating technique; then they were soaked in AgNO 3 solutions; this was followed by irradiation with γ-rays at room temperature and ambient pressure. The structure of these films was examined by high-resolution transmission electron microscopy, and their optical absorption spectra were examined. It has been shown that the Ag particles grown within the porous SiO 2 films are very small and are highly dispersed. On increasing the soaking concentration and subjecting the samples to an additional annealing, a different peak-shift effect for the surface plasmon resonance was observed in the optical absorption measurement. Possible mechanisms of this behaviour are discussed in this paper.
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Pan et al. (2002) studied this question.
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