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The x-ray standing-wave technique through detection of surface-sensitive Auger electrons has determined the surface reconstruction of clean InP(110). Using the back-reflection diffraction geometry from (220) planes, we find the perpendicular displacements of the surface P and In atoms to be +0.18±{}0.1 and -0.48±{}0.08 {}, respectively, from their unrelaxed bulk positions. The use of low-energy x rays combined with a novel method of data analysis opens the general problem of surface reconstruction to study by this technique.
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Woicik et al. (1992) studied this question.
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