This article presents a microwave active Load‐Pull measurement system, using two wide‐band six‐port junctions in order to have nonlinear characterization of power transistors. Experimental results performed on a 900‐μm MESFET for different operating classes are reported and discussed.
No takes yet. Share an insight, caveat, or question.
Deshours et al. (1994) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: