Development of a Low-Temperature Electro-Mechanical Testing Device

Understanding the strain-sensitivity of high temperature superconductors is important for the development of applications. Conductors for magnets experience mechanical loads during all stages of manufacturing and thermal cycling, as well as Lorentz force induced loads during operation. Thus, it is important to study the effects of mechanical loads on HTS conductors in the presence of magnetic field. Here we report on the development of a tensile testing device that was designed to characterize the in-field electromechanical behavior of HTS conductors. The device is capable of applying tension or compression, controlled fatigue cycles, and in-situ transport critical current measurements. We report on the development and capabilities of the device, as well as the initial stress-strain results at room temperature.