Stress dependence of the polarized Raman spectrum of polycrystalline lead zirconate titanate

The stress dependence of the Raman spectrum of a relaxor-based polycrystalline ferroelectric lead zirconate titanate–lead nickel niobate–lead zinc niobate (PZT–PNN–PZN) has been investigated using polarized Raman microprobe spectroscopy. Emphasis has been placed on explicitly working out the second harmonic equations that relate Raman intensities to the angle between the laser polarization direction and selected crystalline axes. Based on these assessments, the effect under polarized light of crystal orientation on the intensity of selected Raman modes has been rationalized and the obtained experimental data interpreted. Raman spectra were collected with both parallel and cross polarization filters and their dependence on stress calibrated with loading the PZT–PNN–PZN samples in a four-point flexural jig. The use of polarized light allowed us to clarify the effect of domain orientation on the Raman spectrum of PZT–PNN–PZN and to perform precise calibrations of the stress dependence of the A1(TO4) Raman mode, independent of domain orientation in both poled and unpoled PZT–PNN–PZN samples. This study demonstrates the feasibility of microscopic stress (in addition to local domain orientation) evaluations in PZT materials using a polarized Raman microprobe.