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CaBi 2 Ta 2 O 9 thin films were deposited on Pt-passivated quartz glass substrates. The 750 °C-annealed thin film was a single phase of layer-structured perovskite and showed random orientation. The thin film exhibited a P–E hysteresis loop. The remanent polarization (Pr) and coercive electric field (Ec) at 13 V were 6 μC/cm2 and 160 kV/cm, respectively. The polarization did not show fatigue after 2×1010 switching cycles.
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Kato et al. (2000) studied this question.
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