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August 1, 1976IEEE Transactions on Electron Devices

Electron irradiation induced recombination centers in silicon-minority carrier lifetime control

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Authors

PRP. Rai‐ChoudhuryUnited States Department of the Army JBJohn J. BartkoUniversity of Maryland, Baltimore JJJ. E. JohnsonUniversity of Manchester

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Rai‐Choudhury et al. (1976) studied this question.

synapsesocial.com/papers/6aa52c0524014aaf7fdd4294 https://doi.org/10.1109/t-ed.1976.18491

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