Suppression of the metal-insulator transition temperature in thin La0.7Sr0.3MnO3 films

In this paper, we illustrate an approach to discriminate between epitaxial strain and other factors responsible for the decrease of the metal–insulator transition temperature (TP) in thin La0.7Sr0.3MnO3 films grown by pulsed laser deposition. Using this approach, we have estimated the effect of the biaxial strain on TP. Ultrathin films, independent of epitaxial strain, do not show any metal–insulator transition over the full temperature range. This finding confirms the existence of an interface dead layer. The strain-independent decrease in TP, relative to its bulk value, observed for a much wider thickness range (up to about 1000Å) can most likely be attributed to oxygen deficiency.