Optical waveguide microscopy is used to image lateral heterogeneities of the electro-optic (EO) response of poled polymer waveguide structures. The sensitivity of the technique is demonstrated for a poly(methylmethacrylate) thin film doped with Disperse Red 1 between gold electrodes in a modified Kretschmann configuration. Even after aging of the poled polymer for one week, heterogeneities due to the anisotropy of the refractive index tensor can be distinguished from those owing to fluctuations of the EO coefficients.
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Aust et al. (1993) studied this question.
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