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ESCA has been combined with argon-ion etching to obtain depth profiles for SnF2-treated enamel. Three zones of products from the topical treatment are detected: a layer of tin oxide on the surface; fluoroapatite + hydroxyapatite at depths below about 0.2 micron; an intermediate layer CaF2, Sn(OH)2, Sn2PO4OH, and fluoroapatite between the two. Sn3F3PO4 was not detected.
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Hercules et al. (1978) studied this question.
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