Localized optical fields in metal nanostructures were measured with high spatial resolution beyond the diffraction limit by using a scattering-type near-field microscope. The semiconductor tip of an atomic force microscope probes nanostructures illuminated with laser light under total internal reflection, so that topographic and scattered near-field images are obtained simultaneously. We successfully observed polarization-dependent plasmonic field enhancement in nanometer-size gaps between adjacent gold particles.
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Fujiwara et al. (2009) studied this question.
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