The growth of cuprous benzotriazole films (CuBTA), formed on Cu monocrystals and vapor deposited films under controlled potential conditions in 1 M 1-H benzotriazole, has been studied by measurement of electrical charge. Film growth follows a direct logarithmic relationship to ∼25 nm thickness and effects of crystallographic orientation are insignificant. Variations in film growth under similar test conditions are attributed to variations in the randomness of CuBTA polymers in the film. A limiting film thickness is predicted, after which slow dissolution occurs without further thickening.
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Tromans et al. (2002) studied this question.
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