Formation of n-Alkane Layers at the Vapor/Water Interface

We present a study on the initial wetting behaviors of two low molecular weight alkanes, heptane and octane, at the vapor/water interface using both neutron and X-ray reflectometry. Combined X-ray and neutron reflectivity studies data showed that a uniform film, which has never been reported, was formed continuously at 25 degrees C. As the adsorptive deposition continued, each adsorbed film was saturated at a specific equilibrium thickness: 48 and 36 A for deuterated heptane and octane, respectively, and 21 A for hydrogenated octane. The thickness of the adsorbed layer measured by neutron reflectivity is in agreement with that measured using X-ray reflectivity. Our observations of continuous and saturated adsorption behaviors are analyzed qualitatively using a kinetic adsorption model.