The technique of high resolution transmission electron microscopy (TEM) permits the first real space observations of the ordering of copper in the sulfur sublattices of chalcocite (Cu2S) and djurleite (Cu1.97 to 1.94S). Copper sulfide thin films formed by the ion exchange process in CdS single crystals are shown to be composed of small domains of the two phases (≈ 10 to 100 nm in diameter), separated by abrupt coherent interfaces. Strain calculations for these interfaces agree qualitatively with experimental observations. In addition, the chalcocite in the vicinity of chalcocite/djurleite interfaces is found to contain a high density of 1/4[010] faults. Structural considerations show that these faults are likely sites for copper vacancies.
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Sands et al. (1982) studied this question.
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