Detailed tabulation of atomic form factors, photoelectric absorption and scattering cross section, and mass attenuation coefficients in the vicinity of absorption edges in the soft X-ray (Z= 30–36,Z= 60–89,E= 0.1–10 keV) – addressing convergence issues of earlier work

A new tabulation of atomic form factors is discussed briefly, extending the validity of the isolated atom approximation and serving as a baseline for near-edge solid-state and XAFS investigations. This is detailed by Chantler [J. Phys. Chem. Ref. Data, (2000), 29, 597-1048] and is the latest component of the FFAST tabulation of NIST.