This paper describes a systematic procedure for constructing a Boolean reliability model from plant schematics, and a technique for determining all sets of single and double component failures which will cause system failure. This technique, called digraph matrix analysis, uses a fault graph instead of the more traditional fault tree. Digraph matrix analysis was recently applied to the system interaction analysis of a very large safety system (over ten thousand components) and is being used to determine security system vulnerabilities.
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I.J. Sacks (1985) studied this question.
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