Microanalysis of polymers using a windowless energy‐dispersive X‐ray detector

The surface compositions of various polymeric films, grown electrochemically on platinum foils, have been investigated by energy‐dispersive x‐ray analysis in conjunction with scanning electron microscopy (SEM/EDS). Comparison of the relative area ratios of peaks for the C and N Kemission lines show that the EDS may be used to study the surface composition of polymers. The evidence presented strongly suggests that there is limited structural degradation and the elemental composition is not changed under the electron beam at relatively low accelerating voltages. This technique statistically samples the repeat units of the polymer. For samples grown in both aqueous and nonaqueous solutions. SEM/EDS provides evidence for extensive contamination with oxygen.