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Defects in high-T c superconductor Ba2YCu3O y , where y varies from 5.8 to 6.5, are examined by high resolution transmission electron microscopy (400 kV). Two kinds of planar defects are observed and they are considered to be formed by an insertion of additional metal and oxygen layers; 1) near CuO1-x layers between two BaO layers, or 2) in the region near Y layers. Weak diffuse electron scattering, which is possibly related to the short range ordering of oxygen vacancies in CuO1-x layers, is also observed in a h k O reciprocal lattice section.
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Matsui et al. (1987) studied this question.
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