Persistence of n-beam dynamical effects in the high-voltage electron diffraction from single thin paraffin microcrystals

The theoretically predicted persistence of n-beam dynamical effects in the electron diffraction from single crystals at high voltages due to relativistic effects is experimentally verified. Crystal structure analysis of an orthorhombic paraffin structure was carried out using single-crystal diffraction data obtained at accelerating voltages from 100 to 1000 kV.