We have studied structure and optical properties of CdS:O thin films deposited on soda lime glass substrates by rf magnetron sputtering in the atmosphere of oxygen/argon gases. According to X‐ray diffraction and confocal Raman scattering data, the films deposited under oxygen partial pressure below 3% show crystalline structure of CdS. On the other hand, X‐ray diffraction, confocal Raman scattering, TEM (transmission electron microscopy) and XPS (X‐ray photoelectron spectroscopy) data are indicative of amorphization, nano‐crystallization, and inclusion of CdO2 in CdS:O thin films obtained under oxygen partial pressure of 5%. The last films have shown significantly increased transmittance in a spectral range above the energy gap of CdS. The origin of this transmittance is discussed by taking into account redistribution of electronic density‐of‐states in amorphous phase, quantum size effect and contribution of CdO2. (© 2013 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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Asaba et al. (2013) studied this question.