NTO and the better known molecular explosives, TATB, RDX, and HMX, were subjected to X-ray and Ultra-violet radiation to determine the relative sensitivity of NTO to radiation damage. X-ray Photoelectron Spectroscopy, (XPS) detected damage induced chemical changes. RDX was the most sensitive molecule to both the X-ray and UV radiation while HMX was only slightly less sensitive. NTO was found to be 1.5 to 3.0 times more sensitive to x-ray and UV damage than TATB. The resulting hierarchy of radiation sensitivity is therefore RDX > HMX ≫ NTO > TATB. XPS analysis of the x-ray damaged residue suggested three decomposition products resulting from loss of nitro, reduction of nitro to nitroso, and loss of NO.
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Beard et al. (1989) studied this question.
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