Experimental data were gathered to determine the effect of sample orientation and electron beam incidence on x-ray spectrometer performance. Dispersive counting techniques were used to compare results. The nature of the backscattered electron yield and the relationship to emitted x radiation is discussed. A wide selection of samples was used to study several wavelengths, including the ultrasoft x-ray region. Analytical data include line-to-background ratios to show the results of various investigated parameters.
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Abelmann et al. (1966) studied this question.
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