The formation of amorphous hydrogenated silicon/silicon nitride (a-Si:H/a-SiNx:H) interfaces is observed in real time by in situ optical reflectance measurements from growing a-Si:H/a-SiNx:H superlattices. The optical data are interpreted by a model of atomically abrupt interfaces with macroscopic roughness on a scale of 10 Å.
No takes yet. Share an insight, caveat, or question.
Yang et al. (1986) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: