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July 1, 2006Japanese Journal of Applied PhysicsOpen Access

Dislocation Density and Critical Current Density of Sm 1+x Ba 2-x Cu 3 O y Films Prepared by Various Fabrication Processes

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Authors

MMMasashi MiuraSeikei UniversityYYYutaka YoshidaNagoya UniversityYIYusuke IchinoAichi Institute of Technology

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Miura et al. (2006) studied this question.

synapsesocial.com/papers/6aa8528201f841cb98aa9000https://doi.org/10.1143/jjap.45.l701
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