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Atmospheric pressure chemical vapour deposition (APCVD) of niobium selenide films on glass substrates was achieved by reaction of di‐tert‐butyl selenide with NbCl5 at 250–600 °C. X‐ray diffraction showed that the NbSe2 films were crystalline and of the 2Ha poly‐type with cell constants close to those expected (a = 3.44 Å; c = 12.58 Å). Marked preferred orientation along either (101) or (200) was noted at higher deposition temperature and this unexpectedly varied depending on distance from the reactor inlet. The films produced at 600 °C showed exactly the Nb/Se ratio expected for NbSe2 by energy dispersive analysis by X‐rays. The films deposited at the substrate temperatures of 500 °C or less were selenium rich with a niobium to selenium ratio of 1:2.5. The films produced at 600 °C were dark‐green, powdery and poorly adhesive. The films produced at 500 °C and below were dark‐brown matte in appearance, they passed the Scotch tape test, but could be scratched with a steel scalpel. SEM showed that the films were composed of plate‐like crystals, which become longer and thicker with increasing deposition temperature. (© Wiley‐VCH Verlag GmbH & Co. KGaA, 69451 Weinheim, Germany, 2006)
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Boscher et al. (2006) studied this question.
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