MIS slow-wave structures over a wide range of parameters

Lossy multilayer, multiconductor MIS microstrip structures are analyzed with the spectral-domain approach over a wide range of frequency and substrate loss. The modal attenuation and propagation constants are presented for two- and four-conductor structures as a function of the substrate loss tangent. Single-conductor structures are characterized with contour plots showing the complex effective dielectric constant as a function of both frequency and conductivity. MIS slow-wave structures are analyzed for both Si-SiO/sub 2/ and GaAs configurations.>