What question did this study set out to answer?

To evaluate the influence of rigid substrate artifacts on atomic force microscopy force-spectroscopy measurements and validate Garcia's bottom-effect correction model.

August 6, 2020SmallOpen Access

Bottom Effect in Atomic Force Microscopy Nanomechanics

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Authors

SCStefano ChiodiniUniversidad de Zaragoza SRSilvia Ruiz‐Rincón PGPablo D. GarcíaNational University of Ireland, Maynooth

Discussion

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Implication

Experimental investigation reveals Garcia's correction resolves substrate artifacts in supported lipid membranes, indicating contact-radius-to-thickness ratio governs nanomechanical measurements.

Key Points

To evaluate the influence of rigid substrate artifacts on atomic force microscopy force-spectroscopy measurements and validate Garcia's bottom-effect correction model.
Performed atomic force microscopy force-spectroscopy on a single-component supported lipid membrane displaying two distinct thickness regions.
Compared sample elasticity calculations derived from the standard Sneddon contact mechanics model against Garcia's bottom-effect artifact correction.
Validated experimental measurements against finite element method numerical simulations.
The conventional Sneddon model calculated two disparate elastic moduli for different thicknesses of the same material, whereas Garcia's correction yielded a single intrinsic Young's modulus.
The ratio of contact radius to sample thickness, rather than indentation depth alone, was identified as the primary parameter governing the bottom-effect artifact.
Finite element simulations fully corroborated the experimental findings, confirming the broad applicability of the correction model to supported soft films.

Cite This Study

Chiodini et al. (2020) studied this question.

synapsesocial.com/papers/6aa8907e4e2a0642f01d6419 https://doi.org/10.1002/smll.202000269

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August 6, 2020SmallOpen Access

Bottom Effect in Atomic Force Microscopy Nanomechanics

View Full Paper

Ask AI

Bookmark

Authors

SCStefano ChiodiniUniversidad de Zaragoza SRSilvia Ruiz‐Rincón PGPablo D. GarcíaNational University of Ireland, Maynooth

Discussion

Member takes

Implication

Experimental investigation reveals Garcia's correction resolves substrate artifacts in supported lipid membranes, indicating contact-radius-to-thickness ratio governs nanomechanical measurements.

Key Points

To evaluate the influence of rigid substrate artifacts on atomic force microscopy force-spectroscopy measurements and validate Garcia's bottom-effect correction model.
Performed atomic force microscopy force-spectroscopy on a single-component supported lipid membrane displaying two distinct thickness regions.
Compared sample elasticity calculations derived from the standard Sneddon contact mechanics model against Garcia's bottom-effect artifact correction.
Validated experimental measurements against finite element method numerical simulations.
The conventional Sneddon model calculated two disparate elastic moduli for different thicknesses of the same material, whereas Garcia's correction yielded a single intrinsic Young's modulus.
The ratio of contact radius to sample thickness, rather than indentation depth alone, was identified as the primary parameter governing the bottom-effect artifact.
Finite element simulations fully corroborated the experimental findings, confirming the broad applicability of the correction model to supported soft films.

Cite This Study

Chiodini et al. (2020) studied this question.

synapsesocial.com/papers/6aa8907e4e2a0642f01d6419 https://doi.org/10.1002/smll.202000269

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