A new sensitive voltammetric method is presented for the determination of trace levels of Cr(VI). The method is based on square wave adsorptive stripping voltammetry (AdSV) in conjunction with the electrochemical batch injection analysis technique at mercury thin-film electrodes. The determination of chromium is made in the presence of cupferron as ligand. Relevant experimental parameters are explored and optimized, such as injection mode, cupferron concentration, accumulation potential and time, and square wave parameters. A preconcentration time of 20 s at −0.8 V vs. SCE results in a detection limit of 32 nM. The relative standard deviation for 12 measurements of 0.12 µM was 6.5%. Possible interferences by other trace metals are considered.
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Brett et al. (2003) studied this question.
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